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Semiconductor

Burn-In Test System

DRAM High-Speed Burn-In Test System

DRAM High-Speed Burn-In Test System（Dedicated to reliability testing）

Memory High-Speed Burn-In Test System

Universal low-speed aging testing system

Integrated aging testing system

Automatic testing equipment for wafer detection

Automatic testing equipment for memory wafer detection

Display driver chip wafer detection automatic testing equipment

Final testing of automated testing equipment

Automatic testing equipment for final storage testing

Display

Signal driven and detection system

LCD LCD module image signal generator and electrical testing system

OLED LCD module image signal generator and electrical testing system

Micro LED&Micro OLED Electrical Testing System

Mini LED Backlight Electrical Testing System

Automated Cell Aging System (ACA)

Fixture

Instrumentation

Color analyzer

Spectrophotometer

Comprehensive measuring instrument for color management

Bright colorimeter series

Spectrometer series

Spectral spectrophotometer series

Flicker and response time measurement series

Imaging angle of view measurement series

ARVR Measurement Series

Optical inspection and yield management system

AVI Visual Inspection Integrated System

API screen check integrated system

Debugging and repair system

Demura Spot Repair Integrated System

Gamma module debugging system

Multi-functional yield management system

Intelligent automation equipment

Mini/Micro testing equipment

Micro LED OLED Micro Display Module AOI

Mini LED lighting detection equipment

Wafer probe table lighting AOI

Mini LED chip appearance inspection equipment

Ink sorting and detection equipment

Mini LED glass based circuit detection equipment

NED detection equipment

New Energy

Power battery intelligent equipment production line

JN series automatic production line for chemical composition and capacity division

Lithium Battery Stacking and Cutting Machine

Battery Assembly Line

Visual inspection system: lithium battery appearance inspection system

Lithium battery testing equipment

Charging and discharging power supply

Bidirectional ACDC power supply

JN84 medium power electronic load

JN502 bidirectional high-voltage DC source

NMP gas concentration detector

Power testing equipment

Battery testing equipment

BMS testing equipment

Fuel cell testing system

PEM electrolytic water hydrogen production testing system

Fuel cell engine testing system
Service and Support

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Welcome to Jingce Electronic

Semiconductor

Automatic testing equipment for final storage testing
Display

EYE2 Color Analyzer
New energy

Cutting and stacking all-in-one machine

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2023-07-14
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展会活动

2023-05-18
与光同行，探索未来 | 抖圈论坛电子亮相2023武汉光博会

2024.03.15
抖圈论坛电子高精度色彩分析仪荣获2023“湖北精品”认定
2024.03.15
武汉市科技局党组书记、局长董丹红一行调研抖圈论坛电子
2023.09.01
聚势为新，启程未来 | 抖圈论坛电子亮相DIC EXPO 2023

About Jingce

Basic Information

President's Message

Business Philosophy

Product Center

Service and Support

After-sales Service

Download Center

Contact Us

Tel：027-87526915
17786527044
Email：jc@paris-diary.com
Website：http://www.paris-diary.com
Address：No. 22, Liufangyuan South Road, East Lake New Technology Development Zone, Wuhan

Jingce Official WeChat Account

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